Veröffentlichungen und Präsentationen

Hier finden Sie Veröffentlichungen und Präsentationen der weltweit stattfindenden COMSOL-Konferenzen. In diesen präsentieren Ihre Fachkollegen ihre neuesten mit COMSOL Multiphysics entwickelten Produkte und Ideen. Die Forschungsthemen umfassen ein weites Feld von Industrien und Anwendungsbereichen, die von Mechanik und Elektronik über Strömungen bis zur Chemie reichen. Nutzen Sie die Quick Search, um die zu Ihrem Forschungsbereich passenden Präsentationen zu finden.

Mechanical Model of RF MEMS Capacitor Structures

R. Chatim[1]
[1]University of Kassel, Kassel, Germany

In order to design an RF MEMS based device, it is beneficial to have information concerning mechanical behavior. For model verification purpose, solution offered by simulation software equipped with predefined physics application is one valuable way to provide initial reference. To avoid unwanted particular total strain in RF MEMS structures, a compensation layer can be utilized. When the number ...

Analysis of Electromagnetic Propagation for Evaluating the Dimensions of a Large Lossy Medium

A. Pellegrini[1] and F. Costa[1]
[1]ALTRAN Italia, Pisa, Italy

In this paper the propagation of a plane wave in a large lossy medium is presented. The investigated geometry consists in a wedgeshaped lossy dielectric embedded in a lossy material with different electromagnetic properties. The aim of the study is to determine the feasibility of a radar technique for measuring the length of the dielectric wedge. In order to address this problem and to evaluate ...

Microwave Inactivation of Bacteria Under Dynamic Heating Conditions in Solid Media

S. Curet[1], M. Mazen Hamoud-Agha[1]
[1]GEPEA, UMR 6144, CNRS, ONIRIS, Université de Nantes, Nantes, France

In this study, COMSOL®4.2a is used to model a microwave heating process in a TE10 rectangular waveguide. The sample consists of a small cylindrical Ca-alginate gel (D = 8 mm, H = 10 mm) inoculated with bacteria Escherichia Coli K12. The sample is placed along the microwave propagation direction into the waveguide. Maxwell’s equations and heat transfer are coupled to a microbial inactivation ...

Capacitance and Inductance Matrices for Multistrip Lines

S. M. Musa, and M. N. O. Sadiku
College of Engineering, Prairie View A&M University, Prairie View, TX, USA

In this paper, we apply COMSOL Multiphysics, a finite element package, to compute the capacitance of a single centered microstrip line and the capacitance and inductance matrices of coupled multistrip lines. We compared our results with those in the literature such as variational technique, method of moments, finite difference method, Green’s function-integral equation technique, and found them ...

Simulation of the Destruction Effects in CMOS-Devices caused by Impact of Fast Transient Electromagnetic Pulses

M. Rohe, S. Korte, and M. Koch
Institute for the Basics of Electrical Engineering and Measurement Science, Leibniz Universität Hannover, Germany

In this paper will be presented how an electronic system and its components will respond in case of an impact of an external electromagnetic pulse (EMP). In the first instance the coupling process of transient electromagnetic pulses into electronic systems will be shown. Out of that the disturbing signal inside the system, which is necessary for the following simulation, will be described ...

Electromagnetic Wave Analysis of Wave And Shielded Stripline

S. Singh[1], A. Marwaha[1]
[1]Department of Electronics and Communication Engineering, Sant Longowal Institute of Engineering Technology Longowal, Punjab, India

Electromagnetic wave analysis of waveguide has been done in this paper with the help of Finite Element Method (FEM) based COMSOL Multiphysics. The design is further extended by placing conductor on a dielectric slab included in the waveguide to form a shielded microstrip transmission line. The simulated models are analyzed to determine the wave propagation characteristics. The validation is done ...

Opto-Asic, Photonische Kristalle

Ricklefs, U., Luo, H.
FH Giessen-Friedberg, FB EI

Mit FEMLAB 2.x und 3.1 wurden Voruntersuchungen zu zwei Anwendungen versucht. Im ersten Projekt sollte die Möglichkeit geklärt werden, FEMLAB für die Verhaltenssimulation integrierter ASIC-Photodioden einzusetzen und in der zweiten Anwendung sollten spezielle photonische Kristalle untersucht werden.

Resonances in Tapered Double-Port TEM Waveguides

J. Kaerst
HAWK, Fachhochschule Hildesheim/Holzminden/Göttingen, Germany

In this paper resonances in tapered double-port TEM waveguides are used as benchmark for simulations. FEM simulations with COMSOL Multiphysics® and simulations using generalised telegraphist's equations with MATLAB® are compared to ananalytical method capable of calculating the resonances of higher order modes. It is valid for tapered double-port TEM waveguides with constant ...

Virtual Homogeneous Isotropic and Real Unhomogeneous Anisotropic Metamaterials

Akalin, T.
IEMN (Institut d’Electronique de Microélectronique et de Nanotechnologie), CNRS UMR 8520, Dpt DHS, USTL (Université des Sciences et Technologies de Lille)

Characteristics on metamaterials and potential applications are presented with the FEMLAB® software simulations results. By definition, metamaterials are materials which exhibit properties which do not exist naturally. Another point is that metamaterials are associated with the negative refractive index property. In the first part, negative refraction will be defined and illustrated by ...

Dielectric Properties Characterization of Thin-film Samples by using Scanning Near-Field Microwave Microscope (SNMM) and FEMLAB

Huang, S.1, Reeves, M.E.1, 2
1 Department of Physics, George Washington University, Washington
2 Naval Research Laboratory, Washington, DC

Scanning Near-field Microwave microscope represents a novel approach to thin film dielectric property analysis with high resolution. In this technique, a sharp probe tip is brought into close enough proximity to the sample surface that the EM field are well described by the near field theory. The question addressed here is how to determine material parameters (in this case dielectric constant) ...

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