How to Solve Surface Potential of a Dielectric under Electron Beam and Secondary Emission (SEY > 1)

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I am working on a model involving the following physics interfaces: Electrostatics, Charged Particle Tracing, Electrostatic Particle-Field Interaction; Study type: Bidirectionally Coupled Particle Tracing. Scenario: Simulate the interaction of an electron beam with a dielectric surface, including secondary electron emission (SEY>1). The electron beam is released using the specify release time feature in CPT.

Currently, I observe that the computed surface potential of the dielectric does not match the expected physical behavior. For example, in the case of a secondary electron emission yield (SEY) greater than 1, the dielectric should theoretically acquire a positive potential due to net electron loss. However, in the results, the surface remains negatively charged. While I understand this arise from how the local electric potential is solved based on electron density (negative) in the mesh cells above the surface, it does not reflect the actual surface charging response.

My question is: How can I solve the dielectric surface potential such that it self-consistently responds to the net current through the surface (i.e., primary electron current in minors secondary electron current out), thereby producing a physically realistic surface potential?


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