Study of a Defective Microstrip Line via Frequency-to-Time FFT Analysis
Application ID: 67361
While transient analyses are useful for time domain reflectometry (TDR) to handle signal integrity (SI) problems, many RF and microwave examples are addressed using frequency domain simulations generating S-parameters. However, from the frequency domain data it is difficult to identify sources for this signal degradation. This example simulates a microstrip line in frequency domain with a couple of line width discontinuities and performs frequency-to-time fast Fourier transform. The computed results help to identify the physical discontinuities and impedance mismatches on the transmission line, by analyzing the signal fluctuation in the time domain.
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